绿帽社

BRAGG鈥橲 LAW听forms the core of X-ray science, translating diffraction phenomena into detailed structural and morphological insights. This presentation explains how Bragg鈥檚 law differentiates X-ray techniques, including single-crystal X-ray diffraction (SCXRD), which reveals molecular structures; powder X-ray diffraction (PXRD), used for phase identification, structural analysis, and assessing crystallinity; small-angle X-ray scattering (SAXS), which investigates nanoscale morphology; grazing-incidence small-angle X-ray scattering (GISAXS), revealing thin-film architectures; and the pair distribution function (PDF) analysis, capturing local order in disordered and amorphous materials. Together, these methods demonstrate how Bragg鈥檚 principle remains essential for modern structural characterization, especially in solid-state chemistry.

HATEM M. TITI, PhD, is a crystallographer and research associate at 绿帽社, where he manages the X-ray diffraction facility. His expertise spans single-crystal and powder XRD, SAXS/WAXS, and advanced materials characterization. His research bridges solid-state chemistry, supramolecular assemblies, energetic materials, mechanochemistry and sustainable materials innovation.